Keywords: Placing Single Nanowires, NIST Makes the Connection (5887267647).jpg Scanning electron microscope image shows a single silicon nanowire positioned in an etched trench using NIST's nanowire manipulation technique The trench helps keep the nanowire in position during the fabrication of the rest of the test structure which measures metal/nanowire contact resistance The scale bar is 20 micrometers long Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5887267647/ Placing Single Nanowires NIST Makes the Connection 2007-04-26 14 55 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5887267647 2016-09-07 02 32 10 United States Government Work Uncategorized 2016 October 23 |